X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 8T3P | |
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 291.15 | 0.1 M Tris pH8.5, 0.85 M NaCl, 32% (w/v) PEG4000 | |
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 1.92 | 35.9 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 46.354 | α = 74.64 | 
| b = 61.79 | β = 81.7 | 
| c = 75.355 | γ = 77.11 | 
| Symmetry | |
|---|---|
| Space Group | P 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER2 X 9M | 2017-08-12 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | APS BEAMLINE 17-ID | 1.000000 | APS | 17-ID | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||
| 1 | 1.51 | 58.45 | 95.9 | 0.058 | 0.069 | 0.036 | 0.998 | 11.6 | 3.5 | 117632 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||
| 1 | 1.51 | 1.59 | 94.1 | 0.416 | 0.496 | 0.266 | 0.871 | 2.9 | 3.4 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 1.51 | 36.749 | 1.98 | 117632 | 5763 | 95.87 | 0.142 | 0.1401 | 0.1404 | 0.1785 | 0.1791 | ||||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| f_dihedral_angle_d | 22.116 | 
| f_angle_d | 1.022 | 
| f_chiral_restr | 0.089 | 
| f_bond_d | 0.009 | 
| f_plane_restr | 0.007 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 7104 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 899 | 
| Heterogen Atoms | 2 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| PHENIX | refinement | 
| XDS | data reduction | 
| Aimless | data scaling | 
| PHASER | phasing | 














