X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 4.2 | 281 | 35% (v/v) PEG 300 and 100 mM phosphate-citrate buffer | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.09 | 41.27 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 52.57 | α = 90 | 
| b = 77.97 | β = 90 | 
| c = 153.65 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 21 21 21 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | PSI PILATUS 6M | 2013-04-25 | M | MAD | ||||||
| 2 | 1 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2013-04-25 | M | MAD | ||||||
| 3 | 1 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2013-04-25 | M | MAD | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SLS BEAMLINE X10SA | 0.9791 | SLS | X10SA | 
| 2 | SYNCHROTRON | SLS BEAMLINE X10SA | 0.9798 | SLS | X10SA | 
| 3 | SYNCHROTRON | SLS BEAMLINE X10SA | 0.9720 | SLS | X10SA | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
| 1 | 1.9 | 50 | 99.3 | 0.078 | 0.127 | 11.8 | 5.3 | 50381 | -3 | 27.43 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
| 1 | 1.9 | 2 | 95.7 | 0.586 | 0.386 | 2.22 | 3.9 | ||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | MAD | FREE R-VALUE | 1.902 | 43.588 | 1.36 | 50301 | 2556 | 99.6 | 0.1864 | 0.1849 | 0.19 | 0.2151 | 0.22 | 30.8366 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| f_dihedral_angle_d | 13.939 | 
| f_angle_d | 1.193 | 
| f_chiral_restr | 0.051 | 
| f_bond_d | 0.008 | 
| f_plane_restr | 0.005 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 5200 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 224 | 
| Heterogen Atoms | 10 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| XSCALE | data scaling | 
| SHARP | phasing | 
| PHENIX | refinement | 
| PDB_EXTRACT | data extraction | 
| XDS | data reduction | 














