X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 1EL3 | |
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION | 5 | 278 | ammonium citrate, PEG4000, pH 5, VAPOR DIFFUSION, temperature 278K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.18 | 43.49 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 47.095 | α = 90 | 
| b = 67.207 | β = 92.38 | 
| c = 49.419 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 1 21 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | PSI PILATUS 6M | 2010-06-11 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SLS BEAMLINE X06SA | 0.88561 | SLS | X06SA | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
| 1 | 1 | 20.7 | 100 | 0.05 | 0.05 | 17.72 | 4.6 | 155837 | 155837 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R | 1EL3 | 1 | 15 | 155786 | 155786 | 7789 | 90.5 | 0.114 | 0.114 | 0.1134 | 0.11 | 0.1376 | 0.14 | RANDOM | |||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| Coordinate Error | ||
|---|---|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution | 
| 14 | 2525.1 | 2979.24 | 
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| s_angle_d | 2.3 | 
| s_non_zero_chiral_vol | 0.102 | 
| s_zero_chiral_vol | 0.099 | 
| s_anti_bump_dis_restr | 0.086 | 
| s_similar_adp_cmpnt | 0.054 | 
| s_from_restr_planes | 0.029 | 
| s_bond_d | 0.016 | 
| s_rigid_bond_adp_cmpnt | 0.006 | 
| s_similar_dist | |
| s_approx_iso_adps | |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 2517 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 309 | 
| Heterogen Atoms | 137 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| MOLREP | phasing | 
| SHELXL-97 | refinement | 
| XDS | data reduction | 
| XDS | data scaling | 














