X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 291 | 1.1 M NaH2PO4 0.2 M K2HPO4 0.1 M citrate / phosphate 0.1 M KCl 0.01M Tris , pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K | 
| 2 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 291 | 1.1 M NaH2PO4 0.2 M K2HPO4 0.1 M citrate / phosphate 0.1 M KCl 0.01M Tris , pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 112.31 | α = 90 | 
| b = 213.9 | β = 90 | 
| c = 138.98 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | C 2 2 21 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | M | SINGLE WAVELENGTH | |||||||
| 2 | 2 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | M | SINGLE WAVELENGTH | |||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SLS BEAMLINE X10SA | 0.9999 | SLS | X10SA | 
| 2 | SYNCHROTRON | SLS BEAMLINE X10SA | 1.738 | SLS | X10SA | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | R Sym I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
| 1,2 | 2.1 | 50 | 99.2 | 0.075 | 0.089 | 11.8 | 3.5 | 96760 | 96760 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
| X-RAY DIFFRACTION | SAD | 2.1 | 46.813 | 1.35 | 96690 | 96690 | 4831 | 99.2 | 0.1736 | 0.172 | 0.17 | 0.2033 | 0.2 | RANDOM | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 12.905 | -11.9695 | -0.9355 | ||||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| f_dihedral_angle_d | 14.031 | 
| f_angle_d | 1.104 | 
| f_chiral_restr | 0.067 | 
| f_bond_d | 0.012 | 
| f_plane_restr | 0.005 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 7768 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 704 | 
| Heterogen Atoms | 68 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| SHARP | phasing | 
| PHENIX | refinement | 
| XDS | data reduction | 
| XDS | data scaling | 














