X-RAY DIFFRACTION
Starting Model(s)
| Initial Refinement Model(s) | |||
|---|---|---|---|
| Type | Source | Accession Code | Details | 
| experimental model | PDB | 1EL5 | |
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 1.5 M Ammonium sulfate, 100 mM Tris-HCl buffer pH8.5 | |
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.06 | 40.31 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 71.367 | α = 90 | 
| b = 69.687 | β = 92.096 | 
| c = 73.095 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 1 21 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | 2022-02-07 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SPRING-8 BEAMLINE BL44XU | 0.9 | SPring-8 | BL44XU | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||
| 1 | 1.35 | 41.67 | 97.1 | 0.035 | 0.997 | 9 | 1.9 | 151911 | |||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||
| 1 | 1.35 | 1.37 | 0.502 | 0.614 | 1.4 | ||||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 1EL5 | 1.35 | 41.67 | 151888 | 8068 | 96.833 | 0.159 | 0.1579 | 0.1578 | 0.1828 | 0.1828 | 18.318 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 0.001 | 0.001 | -0.002 | 0.001 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_other_2_deg | 27.856 | 
| r_dihedral_angle_6_deg | 14.946 | 
| r_dihedral_angle_2_deg | 12.167 | 
| r_dihedral_angle_3_deg | 12.113 | 
| r_dihedral_angle_1_deg | 7.162 | 
| r_lrange_it | 5.837 | 
| r_lrange_other | 5.837 | 
| r_scangle_it | 4.562 | 
| r_scangle_other | 4.497 | 
| r_scbond_it | 3.017 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 5940 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 458 | 
| Heterogen Atoms | 168 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| REFMAC | refinement | 
| XDS | data reduction | 
| Aimless | data scaling | 
| MOLREP | phasing | 














