PanDDA analysis group deposition -- Aar2/RNaseH in complex with fragment F2X-Entry C10a
X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293 | 19% (w/v) Peg 4000, 3% (v/v) DMSO, 0.1M Tris-HCl pH 8.5, 0.2M Li2SO4 | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.46 | 50.02 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 89.174 | α = 90 | 
| b = 81.883 | β = 108.56 | 
| c = 93.451 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | C 1 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | 2019-06-22 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | MAX IV BEAMLINE BioMAX | 0.827 | MAX IV | BioMAX | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||
| 1 | 1.59 | 44.01 | 99.5 | 0.051 | 0.055 | 0.999 | 15.39 | 6.908 | 81326 | 38.877 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||
| 1 | 1.59 | 1.68 | 0.973 | 1.938 | 2.099 | 0.428 | 0.69 | 6.62 | 13855 | ||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | FOURIER SYNTHESIS | THROUGHOUT | 1.59 | 44.01 | 81326 | 4318 | 99.52 | 0.2185 | 0.21714 | 0.23 | 0.21852 | 0.22 | RANDOM | 35.821 | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| 2.69 | -0.47 | -1.71 | -0.54 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 32.859 | 
| r_dihedral_angle_4_deg | 17.574 | 
| r_dihedral_angle_3_deg | 14.127 | 
| r_dihedral_angle_1_deg | 6.304 | 
| r_mcangle_it | 3.698 | 
| r_mcbond_other | 2.753 | 
| r_mcbond_it | 2.752 | 
| r_angle_refined_deg | 1.525 | 
| r_angle_other_deg | 1.358 | 
| r_chiral_restr | 0.071 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 4408 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 148 | 
| Heterogen Atoms | 44 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| XSCALE | data scaling | 
| REFMAC | refinement | 
| PDB_EXTRACT | data extraction | 
| XDS | data reduction | 
| REFMAC | phasing | 
| PHENIX | refinement | 














